An innovative architecture for coordinating low-level measurements from DC to 100 kHz

The Lake Shore MeasureReady™ M81-SSM (Synchronous Source and Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81-SSM is designed to eliminate the complexity of multiple function-specific instrumentation setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance. Read the related lock-in amplifier app note. 

Highly adaptable for a range of material and device research applications, the extremely low-noise system ensures synchronized measurements from 1 to 3 source channels and from 1 to 3 measure channels per half-rack instrument. Also, when its BCS-10 and VM-10 modules are combined, the system offers differential wiring to the sample—a proven method of minimizing environmental noise pickup that can interfere with low‑level measurements.

Components of the M81-SSM

• Connect up to three source modules and up to three measure modules
• Exchange modules and adapt the configuration for each measurement
• All modules are capable of measuring with DC and AC to 100 kHz
• All modules are optimized for the highest precision with common amplitude and frequency references

Flexible measurement capabilities

The M81-SSM provides DC and AC stimulus and measurement capabilities for characterizing materials and devices in cryogenic, room temperature, and high-temperature environments. 

Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.

Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.

The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.

Lake Shore optional MeasureLINK™ software can provide configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore cryogenic probe stations as well as third-party systems. 

These combined capabilities make the M81‑SSM a superior solution for characterizing several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.

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