Three-terminal FET DC transfer curve

SMU-10 characterization of FET spanning 10+ decades of current

Source/measure

When testing multi-terminal devices in a cryogenic probe station, use the M81-SSM with SMU-10 modules to apply voltage or current to the DUT and measure the corresponding current or voltage. The SMU’s topology reduces the number of probe arms by half, significantly minimizing thermal impact. Set compliance limits to protect the DUT from accidental overloads.

Advanced resistance

The M81-SSM’s advanced resistance mode compensates for phase shifts caused by parasitic capacitance, ensuring more accurate resistance measurements. This technique reduces errors significantly, improving measurement accuracy.

Minimize thermal impact by using SMU-10 modules with a probe station. In this example, the orange wire is the source, the light blue wire is the drain, the dark blue wire is the gate, and the black wire is the ground.

Four-wire voltage monitoring

Ideal for high-current devices. The Sense-HI and Sense-LO leads enable 4-wire measurements for built-in device voltage monitoring while sourcing currents.

Synchronized sampling

Patented MeasureSync™ technology ensures perfect timing coordination for AC or DC measurements across multiple SMU-10 modules, eliminating data misalignment errors.

Voltage

Ranges: 10 mV, 100 mV, 1 V, 10 V

Measure sensitivity: <3 nV1

Source noise (DC to 10 MHz): <0.2 mV RMS, <1.2 mV p-p (typical)

Current

Ranges: 1 nA, 10 nA, 100 nA, 1 µA, 10 µA, 100 µA, 1 mA, 10 mA, 100 mA

Measure sensitivity: <1 fA1

DC output resistance: >10 TΩ (typical)

Source noise (DC to 10 MHz): <5 nA RMS, <25 nA p-p (typical)