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Scanning Probe Microscopy (SPM) Probe
VASTA
Scanning Probe Microscopy (SPM) Probe
The low-temperature SPM probe enables high-precision imaging of 2D materials, with a patented detachable head for glovebox preparation, seamless VTI integration, and customization options.

DETAILS

Features & Benefits


• Surface imaging options: AFM/ MFM with piezo-resistance tip
• Sample preparation and encapsulation in a glove box for air-sensitive samples
• Compact design to work with various VTI systems
• Compatible with commercial SPM controllers
• Upgrade options: sample rotation, transport measurement, microscopic samples, etc.
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