DETAILS

M81-SSM Synchronous Source Measure System

The Lake Shore M81-SSM features:

		Unique real-time sampling architecture for synchronous sourcing and measuring
MeasureSync™ technology for simultaneous source module update and measure module sampling timing across all channels DC/AC amplitude and phase detection are user-selectable on all measure channels Common DAC/ADC sampling clock ensures highly precise and consistent source/measure timing coordination between 3 sources and 3 measures

		Designed for scientific-grade low-level measurement applications
Linear module power supply architecture for lowest possible source/measure noise Fully analog signal paths between data converters, modules, and the device under test (DUT) Remote modules for the shortest possible signal path to the DUT, which separates sensitive analog circuits from digital circuits and unwanted sources of interference typical of traditional single-enclosure instrument designs

		The absolute precision of DC plus the detection sensitivity performance of AC instrumentation
All source and measure channels are capable of DC and AC to 100 kHz signals Optimized for fundamental, harmonic, and phase AC plus DC biased measurements Modularity allows for flexible, user-configured modules to suit a specific application

		Unique, flexible instrument/distributed module architecture
Remote-mountable amplifier modules are interchangeable between instruments Modules are dynamically recognized when the system is reconfigured Uses a clean, simple UI and a common programming API for fast setup and a shorter learning curve

An innovative architecture for coordinating low-level measurements from DC to 100 kHz

The Lake Shore MeasureReady™ M81-SSM (Synchronous Source and Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81-SSM is designed to eliminate the complexity of multiple function-specific instrumentation setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance. Read the related lock-in amplifier app note.

This extremely low-noise simultaneous source and measure system ensures inherently synchronized measurements from 1 to 3 source channels and from 1 to 3 measure channels per half-rack instrument — while also being highly adaptable for a range of material and device research applications.

Components of the M81-SSM

Connect up to three source modules and up to three measure modules
Exchange modules and adapt the configuration for each measurement
All modules are capable of measuring with DC and AC to 100 kHz
All modules are optimized for the highest precision with common amplitude and frequency references

Flexible measurement capabilities

The M81-SSM provides DC and AC stimulus and measurement capabilities for characterizing materials and devices in cryogenic, room temperature, and high-temperature environments.

Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.

Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.

The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.

Lake Shore MeasureLINK™ software can provide configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore cryogenic probe stations as well as third-party systems.

These combined capabilities make the M81‑SSM a superior solution for characterizing several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.